Exclusive

Publication

Byline

Location

US Patent Issued to AIPhotonics on May 12 for "Apparatus and method for quantifying the surface flatness of three-dimensional point cloud data" (Chinese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,624,942, issued on May 12, was assigned to AIPhotonics Ltd. (Hong Kong, Hong Kong). "Apparatus and method for quantifying the surface flatness o... Read More


US Patent Issued to YAMADA GIKEN on May 12 for "Piling snow depth measurement system" (Japanese Inventor)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,624,943, issued on May 12, was assigned to YAMADA GIKEN Co. LTD. (Fukui City, Japan). "Piling snow depth measurement system" was invented by Tad... Read More


US Patent Issued to VHIVE TECH on May 12 for "Autonomous UAS data acquisition with context awareness" (Israeli Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,624,944, issued on May 12, was assigned to VHIVE TECH LTD (Herzliya, Israel). "Autonomous UAS data acquisition with context awareness" was inven... Read More


US Patent Issued to Trimble on May 12 for "Surveying target and method with light sector power optimization" (Swedish, French Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,624,945, issued on May 12, was assigned to Trimble Inc. (Westminster, Colo.). "Surveying target and method with light sector power optimization"... Read More


US Patent Issued to TOPCON on May 12 for "Surveying assistance device, surveying assistance system, surveying assistance method, and storage medium" (Japanese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,624,946, issued on May 12, was assigned to TOPCON Corp. (Tokyo). "Surveying assistance device, surveying assistance system, surveying assistance... Read More


US Patent Issued to Groove UnLtd. on May 12 for "Point determination and projection device" (Maryland Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,624,947, issued on May 12, was assigned to Groove UnLtd. LLC (Taneytown, Md.). "Point determination and projection device" was invented by Micha... Read More


US Patent Issued to SEIKO EPSON on May 12 for "Physical quantity sensor and electronic device" (Japanese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,624,948, issued on May 12, was assigned to SEIKO EPSON Corp. (Japan). "Physical quantity sensor and electronic device" was invented by Hideyuki ... Read More


US Patent Issued to SEIKO EPSON on May 12 for "Manufacturing method for electronic device and electronic device" (Japanese Inventor)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,624,949, issued on May 12, was assigned to SEIKO EPSON Corp. (Japan). "Manufacturing method for electronic device and electronic device" was inv... Read More


US Patent Issued on May 12 for "Passive topologically biased Sagnac interferometer as a rotational sensor capable of sensing magnitude and direction of rotation" (Massachusetts Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,624,950, issued on May 12. "Passive topologically biased Sagnac interferometer as a rotational sensor capable of sensing magnitude and direction... Read More


US Patent Issued to UNIVERSITY OF SHANGHAI FOR SCIENCE AND TECHNOLOGY on May 12 for "Underwater point source polarized light detection device and heading angle measurement method" (Chinese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,624,951, issued on May 12, was assigned to UNIVERSITY OF SHANGHAI FOR SCIENCE AND TECHNOLOGY (Shanghai). "Underwater point source polarized ligh... Read More